Inductively Coupled Plasma Spectrometry

Multi-Element Testing That Delivers Rapid, Reliable Insight

ICP-OES (also called ICP-AES) is a multi-element analysis technique that lets you test for many elements simultaneously in materials, products, and raw inputs. Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) and Inductively Coupled Plasma Mass Spectrometry (ICP-MS) are complementary methods for multi-element analysis.

ICP-OES uses a high-temperature argon plasma to measure light emitted by excited atoms and ions, making it ideal for routine, multi-element determinations across raw materials, intermediates, and finished products.

ICP-MS also employs an argon plasma but detects ions by mass spectrometry, achieving far lower detection limits and enabling ultra-trace analysis with sub-ppb sensitivity. Together, these techniques provide rapid, reliable elemental and contaminant analysis for industries such as pharmaceuticals, food and beverages, cosmetics, and specialty chemicals, supporting both quality control and regulatory compliance.

periodic table

How ICP-MS

A sample is introduced into a high-temperature argon plasma, where atoms are atomized, excited, and then ionized. These ions are extracted into a mass spectrometer, where they are separated according to their mass-to-charge ratio and precisely quantified. This process allows ICP-MS to achieve ultra-low level-trace detection limits (down to parts-per-trillion), making it ideally suited for applications that require measurement of elements at extremely low concentration levels.

Application

Practical Uses of ICP-OES/ICP-MS:


  • Screen for heavy metals in raw materials and finished products
  • Quantify active inorganic ingredients like titanium dioxide or zinc oxide
  • Investigate trace and heavy metal contaminants and impurities

Benefits

Why This Technique Matters:


  • Detect multiple elements in one run which saves time and resources
  • Achieve low detection limits for essential regulatory and safety standards
  • Reduce interferences and improve accuracy across varied sample types


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